The CV Series was designed specifically for the semiconductor industry to automatically verify critical wafer carrier dimensions. Fabs use the CV Series to quickly identify out-of-tolerance carriers through in-coming and in-process inspection.  Removing carriers that do not meet specification will improve wafer transfers, maximize equipment availability, and enhance overall yield through a reduction in wafer breakage and particle contamination.

• Automatically verifies critical wafer carrier and FOUP dimensions.

• Provides incoming and in-process inspection                  

• Identifies out-of-tolerance wafer carriers                  

• Reduces wafer carrier and FOUP interoperability issues

Acquired From Rudolph Technologies - Licensing agreement includes Parts Inventory & All Intellectual Property.

Parts & Technical Support, New Products - See Press Release